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1.
Lasers for Measurements And Information Transfer 2004
by Vadim E. Privalov (Editor)
Paperback ,
Society of Photo Optical
(February 2005 )
List Price: $90.00
2.
Optical 3-D Measurement Techniques III: Applications in Inspection, Quality Control, and Robotics Papers Presented to the Conference Organized at Vienna, Oktober 2-4, 1995
by A. Gruen, Technische Universitat Wien, Heribert Kahmen
Book ,
Wichmann
(January 1995 )
3.
Optical Radiant Energy: Radiometry, Concepts, Components and Methods
by Franc C. Grum, Richard Becherer
Hardcover ,
Academic Pr
(August 1979 )
List Price: $80.00
4.
In-Process Optical Measurements and Industrial Methods: Proceedings
by H. A. MacLeod, Peter Langenbeck (Editor), EUROPEAN CONGRESS OF OPTICS 1990 HAGUE (Editor), H. A. MacLeod (Editor)
Paperback ,
Society of Photo Optical
(December 1990 )
List Price: $53.00
5.
Instrumentacion En La Fisica: Memorias De La Escuela Mexicana De Instrumentacion Y Metrologia En La UASLP, 1991
(Spanish )
by J. Urias
Book ,
Editorial Universitaria Potosina
(January 1992 )
6.
Surface Scattering and Diffraction for Advanced Metrology II: 9 July, 2002, Seattle, Washington, USA
by Zu-Han Gu, Society of Photo-Optical Instrumentation Engineers, Boeing Company, Alexei A. Maradudin (Editor), A.A. Maradudin
Book ,
SPIE
(January 2002 )
7.
International Conference on Applied Optical Metrology: 8-11 June 1998, Balatonfured, Hungary
by International Conference on Applied Optical Metrology (1998 Balatonfu, Pramod K. Rastogi (Editor), Society of Photo-Optical Instrumentation Engineers, P.K. Rastogi, Ecole polytechnique federale de Lausanne, Ferenc Gyimesi (Editor), Ecole Polytechnique Federale De Lausanne (c, Pramod K. Rastogi, Ferenc Gyimesi
Hardcover ,
Society of Photo Optical
(August 1998 )
List Price: $99.00
8.
Advanced Characterization Techiniques for Optics, Semiconductors, and Nanotechnologies: 3-5 August 2003 San Diego, California, USA
by Angela Duparre (Editor), Bhanwar Singh (Editor)
Paperback ,
Society of Photo Optical
(November 2003 )
List Price: $90.00
9.
Optical Components, Systems, and Measurement Techniques
by Rajpal S. Sirohi, Mahendra P. Kothiyal
Hardcover ,
Marcel Dekker Inc
(February 1991 )
List Price: $199.95
10.
Interferogram Analysis For Optical Testing
by Daniel Malacara, Manuel Servin, Zacarias Malacara
Hardcover ,
CRC Pr I Llc
(May 2005 )
List Price: $159.95
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