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| 1. |
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Optical Components, Systems, and Measurement Techniques
by Rajpal S. Sirohi, Mahendra P. Kothiyal
Hardcover,
Marcel Dekker Inc
(February 1991)
List Price: $199.95
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Optical Methods of Measurement: Wholefield Techniques
by R.S. Sirohi, F. S. Chau, Fook Siong Chau, Rajpal S. Sirohi
Hardcover,
Marcel Dekker Inc
(May 1999)
List Price: $199.95
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Speckle Metrology
by Rajpal S. Sirohi (Editor), R.S. Sirohi (Editor)
Hardcover,
Marcel Dekker Inc
(May 1993)
List Price: $249.95
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| 4. |
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Optical Methods of Measurement
by Rajpal S. Sirohi
Hardcover,
Taylor & Francis
(July 2007)
List Price: $139.95
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| 5. |
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Selected Papers on Holographic Interferometry: Principles and Techniques
by Rajpal S. Sirohi (Editor), Klaus D. Hinsch (Editor), K. D. Hinsch (Editor), Brian J. Thompson (Editor)
Hardcover,
Society of Photo Optical
(June 1998)
List Price: $118.00
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Selected Papers on Speckle Metrology
by Rajpal S. Sirohi (Editor)
Paperback,
Society of Photo Optical
(July 1991)
Other Formats:
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Hardcover |
List Price: $109.00
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| 7. |
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Selected Papers on Electronic Speckle Pattern Interferometry: Principles and Practice
by Peter Meinlschmidt (Editor), Klaus D. Hinsch (Editor), Rajpal S. Sirohi (Editor)
Hardcover,
Society of Photo Optical
(June 1996)
List Price: $100.00
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